ISSN 1000-1239 CN 11-1777/TP
Effects of Three Factors Under BTI on the Soft Error Rate of Integrated Circuits
Wang Zhen, Jiang Jianhui, Chen Naijin, Lu Guangming,Zhang Ying
Journal of Computer Research and Development . 2018, (5): 1108 -1116 .  DOI: 10.7544/issn1000-1239.2018.20170094