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    面向开源 55 nm 工艺的开源EDA流程与流片验证

    An Open-Source EDA Design Flow for the Open-Source 55nm PDK with Tape-Out Validation

    • 摘要: 开源工艺设计套件(process design kit,PDK)与开源电子设计自动化(electronic design automation,EDA)工具的结合,是开源芯片从功能设计走向可制造验证的重要基础。但现有开源流片实践主要集中于 130 nm/180 nm 工艺或虚拟工艺,真实 55 nm 开源工艺上的端到端设计收敛仍缺乏系统验证。针对 ICsprout 55 布线资源受限、引脚接入困难和时序负载敏感等问题,构建开源 EDA 流程 ECC,通过布局阶段时序与可布线性反馈、灵敏度启发的门级尺寸调整、关键引脚提升及设计规则适配,实现从寄存器传输级(register-transfer level,RTL)代码到GDSII(graphic design system II,GDSII)版图的端到端设计收敛。10 个开源基准设计均在当前公开规则集下实现设计规则收敛与时序收敛;约 7 万标准单元规模的片上系统RetroSoC 完成多项目晶圆(multi-project wafer,MPW)流片和硅后调试。根据公开文献与流片资料,该工作首次基于真实可流片的 ICsprout 55 开源 PDK,在“开源 PDK + 开源 EDA”模式下实现端到端设计收敛与流片验证。相关结果验证了该模式在成熟纳米级工艺节点上支撑数字芯片全流程实现的可行性,并为开源 EDA 流程向更先进工艺节点扩展提供工程参考。

       

      Abstract: The combined use of open-source process design kits (PDKs) and open-source electronic design automation (EDA) tools is important for moving open-source chip development from functional design to manufacturing validation. However, existing open-source tape-out projects have mostly used 130 nm/180 nm processes or virtual processes. End-to-end design closure on a real open-source 55 nm process still lacks systematic validation. To address the limited routing resources, difficult pin access, and high timing sensitivity to load in ICsprout 55, an open-source EDA flow named ECC is developed. ECC achieves end-to-end design closure from RTL to GDSII through timing and routability feedback during placement, sensitivity-guided gate sizing, pin lifting, and design-rule adaptation. All 10 open-source benchmark designs achieved design-rule closure and timing closure under the currently available public rule set. RetroSoC, a SoC design with approximately 70,000 standard cells, was taped out in a multi-project wafer (MPW) run, followed by post-silicon debugging. Based on published papers and public tape-out information, this is the first work to achieve end-to-end design closure and tape-out validation under the “open-source PDK + open-source EDA” model using the open-source ICsprout 55 PDK on a real 55 nm process. The results show that this model can support the full digital chip design flow at a mature nanoscale process node and provide an engineering reference for extending open-source EDA flows to more advanced process nodes.

       

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