C可测乘法器的设计与测试

Design and Test of a C-Testable Multiplier

摘要: 本文给出一种任意多位的保留进位阵列乘法器的自动设计方法.只要给定乘数和被乘数的位数,就可以自动产生出设计.这样设计出来的乘法器是C可测的.只要七个测试就可检测100%的固定型故障.测试数与乘法器的位数无关.

Abstract: Abstract:This paper presents an automatic design method for a carry save array multiplier with arbitrary number of bits.The multiplier is C-Testable.Seven test patterns are sufficient to obtain 100% fault coverage,independent of the number of bits of the multiplier.