龙芯1号处理器的故障注入方法与软错误敏感性分析
Fault Injection and Soft Error Sensitivity Characterization for Fault-Tolerant Godson-1 Processor
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摘要: 在纳米级制造工艺下以及在航天等特殊应用场合中,可靠性将是处理器设计中的一个重要考虑因素.以龙芯1号处理器为研究对象,探讨了处理器可靠性设计中的故障注入方法,并提出了一种同时运行两个处理器RTL模型的故障注入与分析方法,可以实现连续快速的处理器仿真故障注入.在此基础上,进一步分析了龙芯1号处理器的软错误敏感性,通过快速注入大约30万个软错误,保证了分析结果具有较好的统计意义,可以有效指导后续的容错与可靠性设计.Abstract: Dependability plays an important role in the design of nanometer-scale processors and application-specific processors exposed to harsh environments such as cosmic rays. Fault injection is employed to characterize the soft error sensitivity and validate the integrated fault tolerance mechanisms in a fault-tolerant processor. With Godson-1 processor as the research prototype, a novel fault injection technique is presented, which can perform fast and continuous simulation-based fault injections to the subjected processor by running two synthesizable processor RTL models simultaneously. Based on this technique, about 30,0000 soft errors are injected into Godson-1 and the soft error sensitivity of Godson-1 is further investigated to direct the design of a fault-tolerant and dependable Godson-1 processor with good statistical significance.
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Keywords:
- fault-tolerant microprocessor /
- dependability design /
- fault injection /
- soft error
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