CMOS电路电流测试综述
A SURVEY OF CURRENT TESTING FOR CMOS CIRCUITS
-
摘要: 集成电路设计与测试是当今计算机技术研究的主要问题之一．ＣＭＯＳ电路的静态电流（ＩＤＤＱ）测试方法自８０年代提出以来，已被工业界采用，作为高可靠芯片的测试手段．近年来，动态电流（ＩＤＤＴ）测试方法正在研究中．现在正面临一些亟待解决的问题，希望大家的参与．文中对ＣＭＯＳ电路电流测试方法作一综述Abstract: IC design and test is one of the major research areas in computer technology today. I DDQ （quiescent power supply current） testing has become a worldwide accepted test method for detecting CMOS IC defects since its first publication in early 1980’s. Recently, I DDT （dynamic power supply current） testing is under investigation with many open problems. A survey of current testing techniques for CMOS circuits is provided in the paper.
下载: