对实际数字电路中冗余故障的分析
ANALYZING THE REDUNDANT FAULTS IN ISCAS 85 BENCHMARK CIRCUITS
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摘要: 系统地研究了实际数字电路中冗余故障的特性 .详细深入地分析了 ISCAS85基准电路中 10个组合电路的全部 5 5 0个冗余故障 ,找出了它们各自形成的原因并将其分成 5类 .研究发现其中只有 3个故障是最难测的 ,算法中需要大量回溯 ;其它 5 47个故障只要按照电路结构和测试本身的规律来形成测试 ,则基本上无需回溯即可 .Abstract: Properties of redundant faults in practical circuits are studied in this papers. All (550) redundant faults in ISCAS 85 benchmark combinational circuits are analyzed elaborately. They are divided into five parts. The study shows that only three of them are hardest-to-test faults, and they need much backtrack in algorithm. The rest (547) faults need not any backtrack. Tests can be generated according to intrinsic objective law of circuit’s structure and tests themselves.
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