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    BTI作用下三因素对集成电路软差错率的影响

    王真 江建慧 陈乃金 卢光明 张颖

    王真, 江建慧, 陈乃金, 卢光明, 张颖. BTI作用下三因素对集成电路软差错率的影响[J]. 计算机研究与发展, 2018, 55(5): 1108-1116. doi: 10.7544/issn1000-1239.2018.20170094
    引用本文: 王真, 江建慧, 陈乃金, 卢光明, 张颖. BTI作用下三因素对集成电路软差错率的影响[J]. 计算机研究与发展, 2018, 55(5): 1108-1116. doi: 10.7544/issn1000-1239.2018.20170094
    Wang Zhen, Jiang Jianhui, Chen Naijin, Lu Guangming, Zhang Ying. Effects of Three Factors Under BTI on the Soft Error Rate of Integrated Circuits[J]. Journal of Computer Research and Development, 2018, 55(5): 1108-1116. doi: 10.7544/issn1000-1239.2018.20170094
    Citation: Wang Zhen, Jiang Jianhui, Chen Naijin, Lu Guangming, Zhang Ying. Effects of Three Factors Under BTI on the Soft Error Rate of Integrated Circuits[J]. Journal of Computer Research and Development, 2018, 55(5): 1108-1116. doi: 10.7544/issn1000-1239.2018.20170094

     

                     

                  

                         

                     

                        

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