雷韶华 韩银和 李晓维. 组合逻辑电路中软错误率的频域分析方法[J]. 计算机研究与发展, 2011, 48(3): 535-544.
 引用本文: 雷韶华 韩银和 李晓维. 组合逻辑电路中软错误率的频域分析方法[J]. 计算机研究与发展, 2011, 48(3): 535-544.
Lei Shaohua, Han Yinhe, and Li Xiaowei. Soft Error Rate Analysis for Combinational Logic Using Frequency Method[J]. Journal of Computer Research and Development, 2011, 48(3): 535-544.
 Citation: Lei Shaohua, Han Yinhe, and Li Xiaowei. Soft Error Rate Analysis for Combinational Logic Using Frequency Method[J]. Journal of Computer Research and Development, 2011, 48(3): 535-544.

## Soft Error Rate Analysis for Combinational Logic Using Frequency Method

• 摘要: 基于频域的软错误率分析方法可实现快速而精确地分析组合逻辑中软错误的电气屏蔽特性和窗闩屏蔽特性.该方法利用信号和逻辑门的频域特性，计算瞬时错误信号在组合逻辑电路中传播过程.基于频域的分析方法主要分为2个处理步骤：线性系统处理和非线性系统处理.线性系统处理通过电路系统的频率响应来计算输出信号.非线性系统处理瞬时信号的幅度过高而导致晶体管工作在不同的线性系统的情况.基于频域的分析方法采用电路系统的输入输出特性来计算非线性系统的输出信号.数据拟合的方法可以求解粒子击中而导致的瞬时错误信号的信号宽度和通路输出信号的信号宽度之间的函数关系.二者结合可计算由粒子撞击而导致错误信号的概率.使用反相器链的实验结果表明，相对于HSPICE仿真，基于频域的软错误率分析方法是高效的，且可以取得平均96.96%的精确度.使用ISCAS85基准电路和乘法器阵列的实验结果表明，基于频域的软错误率分析方法取得95.82%的精确度.

Abstract: This paper introduces a SER (soft error rate) analysis algorithm using a frequency method which provides a fast and accurate technique to calculate the effects of electrical masking and latching window masking. The frequency method is an approach to analyze the propagation of transient fault using frequency features of each logical gate and signal. It is divided into two procedures, one is linear system procedure, the other is nonlinear system procedure. In linear system procedure, the frequency method calculates the output signal by the frequency response of electrical system. In nonlinear system, the transient faults magnitude is high enough, and transistor passes through different linear systems and causes the top of signal smoothed over. We calculate the output signal of the nonlinear system using input-output feature of electrical system. The functional relationship of the pulse-width of the output signal and the pulse-width of the particle-strike-caused glitch can be calculated by a data fitting method. In this paper, the frequency method and data fitting method are applied to model the probabilities of errors caused by a the particle strike. The experimental results with inverter chains show that the proposed technique achieves 96.96% accuracy and has proved to be time efficient compared with HSPICE simulation. At the same time, the experiments with ISCAS85 benchmark circuits and multiplier array also achieve 95.82% accuracy.

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