Design and Test of a C-Testable Multiplier

MIN Yinghua. Design and Test of a C-Testable MultiplierJ. Journal of Computer Research and Development, 1992, 29(2): 8-12.

Citation:

MIN Yinghua. Design and Test of a C-Testable MultiplierJ. Journal of Computer Research and Development, 1992, 29(2): 8-12.

Citation:

MIN Yinghua. Design and Test of a C-Testable MultiplierJ. Journal of Computer Research and Development, 1992, 29(2): 8-12.

Abstract

Abstract:This paper presents an automatic design method for a carry save array multiplier with arbitrary number of bits.The multiplier is C-Testable.Seven test patterns are sufficient to obtain 100% fault coverage,independent of the number of bits of the multiplier.

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