A Test Generation System for Combinational Circuits

WANG Xinling, WANG Zhanning. A Test Generation System for Combinational CircuitsJ. Journal of Computer Research and Development, 1991, 28(2): 46-50.

Citation:

WANG Xinling, WANG Zhanning. A Test Generation System for Combinational CircuitsJ. Journal of Computer Research and Development, 1991, 28(2): 46-50.

Citation:

WANG Xinling, WANG Zhanning. A Test Generation System for Combinational CircuitsJ. Journal of Computer Research and Development, 1991, 28(2): 46-50.

Abstract

In this paper we will present a Test Generation System for Combinational Circuits(CCTGS).FAN algorithm and parallel simulation are included in the system With a paramete(?) fileoffered by the user.this system can provide a complete test set for a given circuit,or the fault cove-rage for given test patterns.

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