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    SHEN Li. Testability Analysis for Digital Circuits: A SurveyJ. Journal of Computer Research and Development, 1988, 25(9): 18-24.
    Citation: SHEN Li. Testability Analysis for Digital Circuits: A SurveyJ. Journal of Computer Research and Development, 1988, 25(9): 18-24.
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    Testability Analysis for Digital Circuits: A Survey

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    • This paper overviews the testability analysis approaches relating to the design for testability. A number of testability analysis measures (algorithms) and their classification are given. Their evaluation and applications are also outlined.
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