At-Speed Current Test for Testing AT89C51 Microprocessors

Xun Qinglai; Kuang Jishun; Min Yinghua

Journal of Computer Research and Development > 2007 > 44(3): .

Xun Qinglai, Kuang Jishun, Min Yinghua. At-Speed Current Test for Testing AT89C51 Microprocessors[J]. Journal of Computer Research and Development, 2007, 44(3).

Citation:

Xun Qinglai, Kuang Jishun, Min Yinghua. At-Speed Current Test for Testing AT89C51 Microprocessors[J]. Journal of Computer Research and Development, 2007, 44(3).

Citation:

Xun Qinglai, Kuang Jishun, Min Yinghua. At-Speed Current Test for Testing AT89C51 Microprocessors[J]. Journal of Computer Research and Development, 2007, 44(3).

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At-Speed Current Test for Testing AT89C51 Microprocessors

1(College of Computer & Communication, Hunan University, Changsha 410082) 2(Institute of Computing Technology, Chinese Academy of Sciences, Bejing 100080)

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Published Date: March 14, 2007

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Abstract

Abstract

At-speed current testing is a novel method to test digital circuit. This paper is an experimental research for at-speed current testing to be applied to AT89C51 microprocessor. To make the test process feasible, some instruction sequences are carefully selected to let them be able to execute repeatedly by the microprocessor, and the average current consumed by AT89C51 is then measured with a simple current meter. Test generation for the instruction sequence is presented. Experimental results show that the instruction level at-speed current testing technique is feasible for and applicable to AT89C51 microprocessor testing.
- at-speed current testing,
- dynamic current testing,
- microprocessor testing,
- instruction sequence

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