The "G-F" Two-Valued Formula Generating Complete Test Set for Multiple Faults

SHENG Yunhuan

SHENG Yunhuan. The "G-F" Two-Valued Formula Generating Complete Test Set for Multiple FaultsJ. Journal of Computer Research and Development, 1990, 27(1): 57-64.

Citation:

SHENG Yunhuan. The "G-F" Two-Valued Formula Generating Complete Test Set for Multiple FaultsJ. Journal of Computer Research and Development, 1990, 27(1): 57-64.

Citation:

SHENG Yunhuan. The "G-F" Two-Valued Formula Generating Complete Test Set for Multiple FaultsJ. Journal of Computer Research and Development, 1990, 27(1): 57-64.

The "G-F" Two-Valued Formula Generating Complete Test Set for Multiple Faults

SHENG Yunhuan

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It has been proved that a test set generated by the "G-F" two-valued formnls on the primary input lerminals can check s-a-0/s-s-1 multiple-faults in the whole circuit

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The "G-F" Two-Valued Formula Generating Complete Test Set for Multiple Faults

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