A SURVEY OF CURRENT TESTING FOR CMOS CIRCUITS

IC design and test is one of the major research areas in computer technology today. I DDQ （quiescent power supply current） testing has become a worldwide accepted test method for detecting CMOS IC defects since its first publication in early 1980’s. Recently, I DDT （dynamic power supply current） testing is under investigation with many open problems. A survey of current testing techniques for CMOS circuits is provided in the paper.