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    JIANG Jianhui, HU Mou. Safe Logic Elements CMOS B/T Logical Circuits and Their Noise MarginsJ. Journal of Computer Research and Development, 1993, 30(5): 55-61,7.
    Citation: JIANG Jianhui, HU Mou. Safe Logic Elements CMOS B/T Logical Circuits and Their Noise MarginsJ. Journal of Computer Research and Development, 1993, 30(5): 55-61,7.

    Safe Logic Elements CMOS B/T Logical Circuits and Their Noise Margins

    • In this paper,the fault tolerant computing techniques are classified into three classes, that is,fault diagnosis technique,resourses redundancy technique and fail-safe technique.Based on the analysis of traditional fail-safe and self-checking techniques,a unified conceptual model of safe logic systems is developed,and some classes of safe elemeats are diseussed.As a class of extended fail-safe logical element,CMOS 2-of-3 valued logical circuits are analyzed,The definition and gragh method of noise margin of CMOS 2-of-3 valued logical elcments are proposed.
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